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Plasma-assisted MBE of InGaN epilayers with atomically smooth and nanocolumnar morphology, grown on MOVPE GaN/Al2O3 templates

Identifieur interne : 000233 ( Russie/Analysis ); précédent : 000232; suivant : 000234

Plasma-assisted MBE of InGaN epilayers with atomically smooth and nanocolumnar morphology, grown on MOVPE GaN/Al2O3 templates

Auteurs : RBID : Pascal:07-0264049

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English descriptors

Abstract

We report on the state-of-the-art parameters of GaN PA MBE layers grown on GaN/c-Al2O3 MOVPE templates and compare the structural and optical properties of InxGa1-xN layers grown under different conditions on top of the GaN-MBE/GaN-MOVPE/Al2O3 buffer structures. Atomically smooth and structurally perfect GaN and In0.14Ga0.86N epilayers have been achieved. The relatively low values of indium incorporation efficiency αIn in the InGaN layers grown on templates limits the maximum growth temperature and In-content that are necessary to achieve bright RT luminescence in the long-wavelength spectral range ( > 500 nm). It has been proposed that implementation of N-rich growth conditions resulting in the nanocolumnar growth morphology increases αIn and facilitates inhomogeneous spatial distribution of In in InGaN alloys, which play a crucial role in the red shift of the RT luminescence up to 510 nm and enhancement of its intensity.

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Pascal:07-0264049

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<title xml:lang="en" level="a">Plasma-assisted MBE of InGaN epilayers with atomically smooth and nanocolumnar morphology, grown on MOVPE GaN/Al
<sub>2</sub>
O
<sub>3</sub>
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<name sortKey="Jmerik, V N" uniqKey="Jmerik V">V. N. Jmerik</name>
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<name sortKey="Ivanov, S V" uniqKey="Ivanov S">S. V. Ivanov</name>
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<term>Aluminium oxides</term>
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<term>Gallium nitrides</term>
<term>Growth mechanism</term>
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<term>Molecular beam epitaxy</term>
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<term>Traitement par plasma</term>
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<front>
<div type="abstract" xml:lang="en">We report on the state-of-the-art parameters of GaN PA MBE layers grown on GaN/c-Al
<sub>2</sub>
O
<sub>3</sub>
MOVPE templates and compare the structural and optical properties of In
<sub>x</sub>
Ga
<sub>1-x</sub>
N layers grown under different conditions on top of the GaN-MBE/GaN-MOVPE/Al
<sub>2</sub>
O
<sub>3</sub>
buffer structures. Atomically smooth and structurally perfect GaN and In
<sub>0.14</sub>
Ga
<sub>0.86</sub>
N epilayers have been achieved. The relatively low values of indium incorporation efficiency α
<sub>In</sub>
in the InGaN layers grown on templates limits the maximum growth temperature and In-content that are necessary to achieve bright RT luminescence in the long-wavelength spectral range ( > 500 nm). It has been proposed that implementation of N-rich growth conditions resulting in the nanocolumnar growth morphology increases α
<sub>In</sub>
and facilitates inhomogeneous spatial distribution of In in InGaN alloys, which play a crucial role in the red shift of the RT luminescence up to 510 nm and enhancement of its intensity.</div>
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MOVPE templates and compare the structural and optical properties of In
<sub>x</sub>
Ga
<sub>1-x</sub>
N layers grown under different conditions on top of the GaN-MBE/GaN-MOVPE/Al
<sub>2</sub>
O
<sub>3</sub>
buffer structures. Atomically smooth and structurally perfect GaN and In
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Ga
<sub>0.86</sub>
N epilayers have been achieved. The relatively low values of indium incorporation efficiency α
<sub>In</sub>
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<s5>15</s5>
</fC03>
<fC03 i1="13" i2="3" l="ENG">
<s0>Gallium nitrides</s0>
<s2>NK</s2>
<s5>15</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE">
<s0>Indium nitrure</s0>
<s2>NK</s2>
<s5>16</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG">
<s0>Indium nitrides</s0>
<s2>NK</s2>
<s5>16</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE">
<s0>Aluminium oxyde</s0>
<s2>NK</s2>
<s5>17</s5>
</fC03>
<fC03 i1="15" i2="3" l="ENG">
<s0>Aluminium oxides</s0>
<s2>NK</s2>
<s5>17</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE">
<s0>Nitrure</s0>
<s2>NA</s2>
<s5>18</s5>
</fC03>
<fC03 i1="16" i2="3" l="ENG">
<s0>Nitrides</s0>
<s2>NA</s2>
<s5>18</s5>
</fC03>
<fC03 i1="17" i2="X" l="FRE">
<s0>Condition opératoire</s0>
<s5>29</s5>
</fC03>
<fC03 i1="17" i2="X" l="ENG">
<s0>Operating conditions</s0>
<s5>29</s5>
</fC03>
<fC03 i1="17" i2="X" l="SPA">
<s0>Condición operatoria</s0>
<s5>29</s5>
</fC03>
<fC03 i1="18" i2="3" l="FRE">
<s0>Répartition spatiale</s0>
<s5>30</s5>
</fC03>
<fC03 i1="18" i2="3" l="ENG">
<s0>Spatial distribution</s0>
<s5>30</s5>
</fC03>
<fC03 i1="19" i2="3" l="FRE">
<s0>Déplacement raie</s0>
<s5>31</s5>
</fC03>
<fC03 i1="19" i2="3" l="ENG">
<s0>Spectral line shift</s0>
<s5>31</s5>
</fC03>
<fC03 i1="20" i2="3" l="FRE">
<s0>Séparation phase</s0>
<s5>32</s5>
</fC03>
<fC03 i1="20" i2="3" l="ENG">
<s0>Phase separation</s0>
<s5>32</s5>
</fC03>
<fC03 i1="21" i2="3" l="FRE">
<s0>Photoluminescence</s0>
<s5>33</s5>
</fC03>
<fC03 i1="21" i2="3" l="ENG">
<s0>Photoluminescence</s0>
<s5>33</s5>
</fC03>
<fC03 i1="22" i2="3" l="FRE">
<s0>InGaN</s0>
<s4>INC</s4>
<s5>46</s5>
</fC03>
<fC03 i1="23" i2="3" l="FRE">
<s0>GaN</s0>
<s4>INC</s4>
<s5>47</s5>
</fC03>
<fC03 i1="24" i2="3" l="FRE">
<s0>Al2O3</s0>
<s4>INC</s4>
<s5>48</s5>
</fC03>
<fC03 i1="25" i2="3" l="FRE">
<s0>InxGa1-xN</s0>
<s4>INC</s4>
<s5>49</s5>
</fC03>
<fC03 i1="26" i2="3" l="FRE">
<s0>In</s0>
<s4>INC</s4>
<s5>50</s5>
</fC03>
<fC03 i1="27" i2="3" l="FRE">
<s0>8115H</s0>
<s4>INC</s4>
<s5>71</s5>
</fC03>
<fC03 i1="28" i2="3" l="FRE">
<s0>8110B</s0>
<s4>INC</s4>
<s5>72</s5>
</fC03>
<fC03 i1="29" i2="3" l="FRE">
<s0>8115K</s0>
<s4>INC</s4>
<s5>73</s5>
</fC03>
<fC03 i1="30" i2="3" l="FRE">
<s0>8105E</s0>
<s4>INC</s4>
<s5>74</s5>
</fC03>
<fN21>
<s1>176</s1>
</fN21>
</pA>
<pR>
<fA30 i1="01" i2="1" l="ENG">
<s1>MBE-XIV: International Conference on Molecular Beam Epitaxy</s1>
<s2>14</s2>
<s3>Tokyo JPN</s3>
<s4>2006-09-03</s4>
</fA30>
</pR>
</standard>
</inist>
</record>

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